An Assessment of the National Institute of Standards and by National Research Council, Division on Engineering and PDF

By National Research Council, Division on Engineering and Physical Sciences, Board on Assessment of National Institute of Standards and Technology Programs

ISBN-10: 0309085268

ISBN-13: 9780309085267

ISBN-10: 0309503264

ISBN-13: 9780309503266

The nationwide Institute of criteria and expertise (NIST) Measurements and criteria Laboratories (MSL) offer technical management for the nation's size and criteria infrastructure and guarantee the provision of crucial reference facts and dimension functions. At NIST's request, the nationwide study Council (NRC) incorporates out a biennial overview of the seven MSL. The review specializes in each one laboratory's technical caliber and benefit; and effectiveness. It additionally examines the relevance of the NIST courses and the way good laboratory amenities, apparatus, and body of workers may be able to fulfil the MSL project. This record offers an total overview of the MSL by means of distinctive tests of every of the seven laboratories.

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Extra info for An Assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories: Fiscal Year 2002

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The panel is not taking a position on whether patents should or should not be an EEEL goal or even whether they should or should not be a measured output. However, the panel does suggest that the NIST policy in this area be clarified, as conversations with the laboratory staff revealed a range of understanding of the criteria for deciding when to apply for a patent and the process and support available for doing so. If a clear policy does exist at the NIST level, this confusion would appear to be a communications issue.

The Microelectromechanical Systems project has made good progress in the use of MEMS devices to measure stress and elasticity in the thin-film materials widely used by the semiconductor industry. In 2001, the division demonstrated a new optical vibrometer, which measures the resonant properties of microcantilever beams used in MEMS. This technique can measure the properties of cantilever beams constructed with one material, two different materials, or the sandwiches of many materials that are found in semiconductor devices.

Although the assessment panel has not made any specific study of present and future needs in this area, the panel’s familiarity with industry trends in general suggests that the present demand for wider bandwidth and higher current in AC-DC measurements will continue. The need for high frequencies (>105 Hz) and high current (>50 A) in combination will probably continue as a host of new monitoring, communications, and high-frequency power technologies continue to develop. The farad and ohm are basic electrical units, and maintaining dependable, consistent, and traceable standards for them must continue to be a core priority for the Electricity Division.

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An Assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories: Fiscal Year 2002 by National Research Council, Division on Engineering and Physical Sciences, Board on Assessment of National Institute of Standards and Technology Programs


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